Fault Modeling of ECL for High Fault Coverage of Physical Defects
نویسندگان
چکیده
منابع مشابه
Gate level representation of ECL circuits for fault modeling
Bipolar EmitterCoupled Logic (ECL) devices can now be fabricatedat high densities andlowerpowerconsumption. Withtheachievementof lowpowerand highdensities, ECLtechnology isexpectedtobeusedwidelyinhighperformance digital circuits. This necessitates the need for obtaining optimumgate level models for ECLcircuits. A simple technique to obtaingate level model of an ECLcircuit is presented. Thegate ...
متن کاملModeling Fault Coverage of Random Test Patterns
We present a new probabilistic fault coverage model that is accurate, simple, predictive, and easily integrated with the normal design flow of built-in self-test circuits. The parameters of the model are determined by fitting the fault simulation data obtained on an initial segment of the random test. A cost-based analysis finds the point at which to stop fault simulation, determine the paramet...
متن کاملFault coverage modeling in nonlinear dynamical systems
In this paper, we propose an approach for modeling fault coverage in nonlinear dynamical systems. Fault coverage gives a measure of the likelihood that a system will be able to recover after a fault occurrence. In our setup, the system dynamics are described by a standard state-space model. The system input (disturbance) is considered to be unknown but bounded at all times. Before any fault occ...
متن کاملCoverage Modeling for Dependability Analysis of Fault-Tolerant Systems
Several different models for predicting coverage in a fault-tolerant system are discussed, including models for permanent, intermittent, and transient errors. Markov, semi-Markov, nonhomogeneous Markov, and extended stochastic Petri net models for computing coverage are developed. Two types of events which interfere with recovery are examined; methods for modeling such events (applicable if the...
متن کاملExperimental Assessment of Fault Coverage for Fault-Tolerant High-Performance Processors
⎯ In this paper, we present a comprehensive experimental assessment of fault coverage for a fault-tolerant VLIW processor, which consists of the error detection, error rollback recovery and reconfiguration mechanisms. We implement the proposed design of fault-tolerant VLIW in VHDL and employ the fault injection to investigate the effects of fault duration, workload variation and the number of r...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: VLSI Design
سال: 1996
ISSN: 1065-514X,1563-5171
DOI: 10.1155/1996/80472